McXtrace: Test_ML_elliptic
[ Identification
| Description
| Examples
| Input parameters
| Links ]
The Test_ML_elliptic Instrument
Unit test instrument for Multilayer_elliptic
Identification
- Site: Tests_optics
- Author: Your name (email)
- Origin: Your institution
- Date: Current Date
Description
Tests the correct working of the mulitlyer_elliptic component both using a
reflectivity file and the kinematical approximation.
Examples
(Test cases in bold)
- Test: Test_ML_elliptic.instr S1=1 S2=2 gamma=1.2 fromfile=0 Detector: emon1_I=6.91956e-21
- Test: Test_ML_elliptic.instr S1=1 S2=2 gamma=1.2 fromfile=1 Detector: emon1_I=4.61321e-21
- Test: Test_ML_elliptic.instr S1=1 S2=2 gamma=1.2 fromfile=1 fxw=2e-2 fyh=1e-3 Detector: emon1_I=9.22372e-08
Input parameters
Parameters in
boldface are required;
the others are optional.
| Name | Unit | Description | Default |
| S1 | m | Distance from source focus to multilayer centre. | 1 |
| S2 | m | Distance from multilayer centre to focal point | 2 |
| gamma | deg | Design glancing angle at centre. | 1.2 |
| fromfile | | If nonzero read reflectivity number from a datafile ("reflectivity.txt") | 1 |
| fxw | m | width of the beam | 1e-9 |
| fyh | m | height of the beam | 1e-9 |
Links
[ Identification
| Description
| Examples
| Input parameters
| Links ]
Generated for mcxtrace 3.8.4
Last Modified: Friday, 11-Sep-2026 15:00:07 CEST